PASICHNYY, M.; TATARCHUK, Y. SIMULATION OF THE SIZE EFFECT IN THE PROCESS OF FAILURES OF MICROELECTRONIC DEVICES ON THE BASIS OF THE APPROACH OF PERCOLATION CLUSTER FORMATION. Cherkasy University Bulletin: Applied Mathematics. Informatics, [S. l.], n. 1, p. 49–57, 2021. DOI: 10.31651/2076-5886-2021-1-49-57. Disponível em: https://ami-ejournal.cdu.edu.ua/article/view/4606. Acesso em: 16 may. 2026.